The electron beam hits the sample, producing secondary electrons from the sample. These electrons are collected by a secondary detector or a backscatter detector, converted to a voltage, and amplified. The amplified voltage is applied to the grid of the CRT and causes the intensity of the spot of light to change. The image consists of thousands of spots of varying intensity on the face of a CRT that correspond to the topography of the sample.
Thursday, March 19, 2009
Beam's Path through the Column in Scanning Electron Microscope (SEM)
The electron beam hits the sample, producing secondary electrons from the sample. These electrons are collected by a secondary detector or a backscatter detector, converted to a voltage, and amplified. The amplified voltage is applied to the grid of the CRT and causes the intensity of the spot of light to change. The image consists of thousands of spots of varying intensity on the face of a CRT that correspond to the topography of the sample.
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