Thursday, March 19, 2009

Scanning Electron Microscope (SEM)

Scanning Electron Microscope (SEM)
The Scanning Electron Microscope (SEM) is a microscope that uses electrons rather than light to form an image. There are many advantages to using the SEM instead of a light microscope.

The scanning electron microscope (SEM) is a type of electron microscope that images the sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern. The electrons interact with the atoms that make up the sample producing signals that contain information about the sample's surface topography, composition and other properties such as electrical conductivity.

The SEM has a large depth of field, which allows a large amount of the sample to be in focus at one time. The SEM also produces images of high resolution, which means that closely spaced features can be examined at a high magnification. Preparation of the samples is relatively easy since most SEMs ony require the sample to be conductive. The combination of higher magnification, larger depth of focus, greater resolution, and ease of sample observation makes the SEM one of the most heavily used instruments in research areas today.

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